Circuit Edit Systems

The Thermo Scientific™ Centrios™ Advanced Circuit Edit System enables rapid prototyping and first silicon debug and repair for 14 nm and above design rule devices. It enables advanced front and backside edits with unparalleled editing control and precision.

Featuring the new Thermo Scientific Celta Focused Ion Beam (FIB) Column, the Centrios HX System delivers high resolution at low beam currents and low landing energies, allowing you to perform edits accurately and with minimum circuit damage.