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Electron Backscatter Diffraction Spectrometers
Spectromoters that employ microstructural-crystallographic characterization to analyze material structure, crystal orientation, phase, or strain. Products are used with electron microscopes and in the study of crystalline/polycrystalline materials.
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Quasor II™ EBSD System Thermo Scientific™
Camera:
- Camera dwell time from 0.1 to 5000 milliseconds
- Collection speed up to 600 fps
- Diffraction pattern image resolution at 320 x 240 pixels
- Camera binning up to 2x2
- Software controlled motorized insertion / retraction with < 0.1 mm variance
- Dynamic gain up to 24x
- Index and Pattern quality map
- HKL orientation map
- UVW orientation map
- Euler orientation map
- Crystal structure Phase maps
- Grain boundary axis and angle maps
- Grain size analysis
- Grain shape analysis
- Grain boundary CSL and special boundary maps
- Pole figures
- Inverse pole figures
- Windows 10, Windows 8.1, Windows 7 compatible, 64-bit compatible
- Editable crystal database (CIF format)
- Single click reporting to Microsoft Word
- Export and import entire map of detected Kikuchi bands to
- *.ang or *.csv files (2)
Lumis EBSD Detector Thermo Scientific™
Camera: High sensitivity CMOS, reverse zoom optics lens. Data Processing and Displays: Mapping – display of EBSP quality, phase, orientation, grain boundaries, special boundaries (e.g. CSL), and texture; Grain reconstruction – grain size, shape, morphology; Pole figure, Inverse pole figure, ODF Description: Lumis EBSD detector for SEMs. Indexed Pattern Acquisition Rate: 4096 x 4096 pixels at 1 ms dwell time.