Electron microscope accessories are products designed for use with a wide range of electron microscopes and include software, sample holders, and more.
Thermo Scientific™ Tensile Sample Holder for Thermo Scientific™ Phenom XL. Tensile testing is one of the simplest and most widely used mechanical tests. By measuring the force required to elongate a specimen to breaking point, material properties can be determined that will allow designers and...
The Thermo Scientific™ Standard Sample Holder for the Thermo Scientific™ Phenom™ XL Desktop SEM is the compact stage allowing analysis of samples of up to 100 mm x 100 mm. In spite of this much larger sample size, a proprietary loading shuttle keeps the vent/load cycle to a minimum, which in...
The ultimate high-resolution sample holder. Shipped as standard with every Thermo Scientifc™ Phenom™ Pure/Pro(X)/Pharos system. Optimized for best imaging results and able to accommodate 3D-samples mounted on standard sample pin stubs.
The Thermo Scientific™ Temperature Controlled Sample Holder has been developed by Thermo Fisher Scientific and Deben in order to study vacuum-sensitive and vulnerable samples such as biological, food or organic coatings.
The Thermo Scientific™ flexProber™ is our newest SEM-based nanoprobing platform, providing electrical characterization and fault isolation capabilities for process development, device design debug, and failure analysis.
Description: Nanoprobing for electrical fault isolation and efficient TEM workflows to improve semiconductor failure analysis. Type: FIB-SEM. Resolution: LEEN2™ SEM Column.
Thermo Scientific™ HeliScan™ is an advanced microCT system designed with both helical and circular scanning trajectories to provide universities, research institutes, core laboratories and E&P operators a flexible instrument to meet their specific lab requirements.
The Thermo Scientific™ Velox™ user interface with its integrated design combines the comprehensive access to the microscope optics and detectors to provide superior experimental control for the highest reproducibility, yield and best support for quantitative S/TEM studies in material science.
With the Thermo Scientific™ 3D Roughness Reconstruction application, the Thermo Scientific™ Phenom™ Desktop SEM systems are able to generate three-dimensional images and submicrometer roughness measurements.
Avizo Software allows reliable advanced materials properties extraction and characterization in many materials science applications such as energy storage, metals and alloys, composites and polymers, and semiconductors.
The Thermo Scientific™ Meridian™ S Inverted Static Optical Fault Isolation System enables Failure Analysis engineers in fabs and service labs to localize electrical faults in semiconductor devices. It offers high-sensitivity Static Laser Stimulation (IR-OBIRCH) and Photon Emission capabilities for...
The Thermo Scientific™ Meridian™ 7 system provides visible laser voltage imaging and probing and dynamic laser stimulation on sub-10nm devices. By avoiding a requirement for ultra-thin substrates, it preserves the integrity and functionality of the device under test to provide a reliable and...
The Thermo Scientific Meridian EX System is an innovative electron-beam-based solution for precise defect localization in advanced logic devices. Using groundbreaking e-beam technology, rather than optical (laser), it allows probing through complex wiring networks from the frontside or backside of...