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Focused Ion Beam Electron Microscopes
Focused ion beam, or FIB, electron microscopes, use ion beams for high-resolution imaging of samples. Products can be used in laboratory, industrial, and other settings for various applications.
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Helios™ G4 PFIB UXe DualBeam™ FIB/SEM for Materials Science Thermo Scientific™
Thermo Scientific™ Helios™ G4 PFIB delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining. Helios G4 PFIB UXe is part of the fourth generation of the industry-leading Helios DualBeam family. It combines the new PFIB 2.
Helios™ G4 PFIB UXe DualBeam™ for Semiconductors Thermo Scientific™
The Thermo Scientific™ Helios™ G4 PFIB UXe DualBeam™ System provides unique capabilities to enable damage-free delayering of semiconductor devices and advanced failure analysis of 3D packages, in addition to a wide range of other large area FIB processing applications.
Helios™ G4 PFIB HXe DualBeam™ for Semiconductors Thermo Scientific™
The Thermo Scientific™ Helios™ G4 PFIB HXe DualBeam™ System provides unique capabilities to enable damage-free delayering of 10nm semiconductor devices and advanced failure analysis of 3D packages, in addition to a wide range of other large area FIB processing applications.
Helios™ G4 PFIB CXe DualBeam™ FIB/SEM for Materials Science Thermo Scientific™
Thermo Scientific™ Helios™ G4 PFIB delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining. Helios G4 PFIB CXe is part of the fourth generation of the industry-leading Helios DualBeam family. It combines the new PFIB 2.
Helios™ G4 PFIB CXe DualBeam™ for Semiconductors Thermo Scientific™
The Helios G4 PFIB CXe DualBeam System enables you to: Reveal the finest details using best-in-class Elstar™ SEM Electron Column with high-current UC+ monochromator technology, enabling nanometer SEM image resolution and surface sensitivity.
Helios™ 5 Laser PFIB Thermo Scientific™
Fastest high-quality sub-surface and 3D characterization at millimeter scale with nanometers resolution. The Thermo Scientific™ Helios™ 5 Laser PFIB delivers unmatched capabilities for extreme large-volume 3D analysis, Ga-free sample preparation, and precise micromachining.
Helios 5 EXL DualBeam Thermo Scientific™
Description: 300mm full-wafer focused ion beam scanning electron microscope. Type: FIB-SEM. Resolution: 1.0 nm @ 15 kV; 0.9 nm @ 1 kV
CleanMill Broad Ion Beam System Thermo Scientific™
Description: CleanMill Broad Ion Beam System (cross section polisher) Ion beam polishing and ion beam milling for SEM imaging. Type: FIB-SEM.